Parametric

For parametric simulation a new parameter has been included that allows the user to change the percentage of Templok® tile assigned to a model. This allows users to evaluate different levels of Templok from 0 – 100% alongside all other parameters available in the IESVE parametric tool.
 
Parametric tool showing the new 'Armstrong Ultima Templok (%)' parameter
 
The inclusion of the Armstrong Templok Ceiling tile in parametric provides users with a powerful tool to investigate hundreds of combinations to determine the best strategy for inclusion of PCM in their building.
For example, in a sample model the parametric tool has been used to evaluate the following variations for a building in Los Angeles:
 
Parallel Coordinate Plot (PCP) showing the impact of variations to the Armstrong Templok Tile amongst other parameters
 
In this case, the permutation with the lowest EUI included: